ate

TreeATE是Tree Automatic Test Equipment的缩写，专注服务于工厂成品或半成品测试自动化的一种开源软件工具平台。

A high-level Hardware Abstraction Layer (HAL) for RF test stations with Digital Twin support, SCPI control, and async measurements.

Concurrent Mapping and Localization Library

STDF to Wafer Bin Map utility written in Python

Implements SemRe-Rank: improving automatic term extraction by incorporating semantic relatedness with personalised pagerank

Adaptive debiased machine learning of treatment effects with the highly adaptive lasso

Extract location of pads from a kicad layout. Useful for generating a test point report.

Code for causal isotonic calibration for heterogeneous treatment effects (appeared in ICML, 2023)

EKF-SLAM and FastSLAM1.0 implementation on the UTIAS Multi-Robot Cooperative Localization and Mapping Dataset. It also provides metrics for evaluation like: ATE, RPE and Landmark RMSE.

This project has scripts which can be used to compress test vectors or patterns generated to use on SoC testers like Advantest, Ultraflex. The concept is universal and can be extended to any SoC tester.

集成电路测试（ATE）知识库 + Agent Skill：加速科技 ST2516/ST2500 平台与六个实训案例，27 篇中文笔记

⚡ A unified hardware test automation platform bridging the gap between RD lab verification, CI/CD HIL, and 24/7 factory production.

Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.

Can Cross-domain Term Extraction Benefit from Cross-lingual Transfer?

Make large ATE .stdf(.gz) files accessible (mostly PTR "RESULT" data, binning, test limits). Optionally fast binary import into Octave, with emphasis on working with multiple datasets.

Desktop and browser wafer map viewer for semiconductor test data — Tauri v2, Rust/WASM parsers for STDF/ATDF/CSV/JSON/Parquet, wafermap rendering

Simulation for "Method-of-Moments Inference for GLMs and Doubly Robust Functionals under Proportional Asymptotics"

Automatic Term Extraction with NOBI Sequence Labeling approach

PCB Assembly Test Toolkit for LabVIEW is a collection of Measurement Library, Automation Examples for PCB Assembly electrical functional test (PCBA FCT). Created and supported by NI

A project in the course of Causal Inference